In recent years there has been considerable progress in the area of microprocessor controlled automated test systems for the measurement of magnetic properties of materials [1,2]. Lately commercial systems have become available [3,4]. This has been made possible by the rapid growth of the microcomputer industry in the last eight years so that independent, or personal, computers have become available with enough capability and at sufficiently low cost to make on line control and data logging of even quite small experimental systems both economical and desirable.
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